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Conference Object(2)
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IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops(1)
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)(1)
Finding Significant Features for Few-Shot Learning Using Dimensionality Reduction
Conference ObjectAbstract: Few-shot learning is a relatively new technique that specializes in problems where we have little amPalabras claves:Few-shot learning, image classification, Metric learningAutores:Andrés Mendez-Vazquez, Garcia I., Gonzalez-Zapata J., Mendez-Ruiz M., Ochoa-Ruiz G.Fuentes:scopusGuided Deep Metric Learning
Conference ObjectAbstract: Deep Metric Learning (DML) methods have been proven relevant for visual similarity learning. HoweverPalabras claves:Autores:Andrés Mendez-Vazquez, Flores-Araiza D., Gonzalez-Zapata J., Mendez-Ruiz M., Ochoa-Ruiz G., Reyes-Amezcua I.Fuentes:scopus