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Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2 (110) surface
ArticleAbstract: The atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by thePalabras claves:Autores:Besenbacher F., Enevoldsen G.H., Foster A.S., Henry P. Pinto, Hofer W.A., Jensen M.C.R., Kühnle A., Lauritsen J.V., Reichling M.Fuentes:googlescopusImaging of the hydrogen subsurface site in rutile TiO2
ArticleAbstract: From an interplay between simultaneously recorded noncontact atomic force microscopy and scanning tuPalabras claves:Autores:Besenbacher F., Enevoldsen G.H., Foster A.S., Hammer B., Henry P. Pinto, Hofer W.A., Jensen M.C.R., Lauritsen J.V.Fuentes:googlescopusSTM topography and manipulation of single Au atoms on Si(100)
ArticleAbstract: The low-temperature (12 K) adsorption of single Au atoms on Si(100) is studied by scanning tunnelingPalabras claves:Autores:Chiaravalloti F., Dujardin G., Foster A.S., Henry P. Pinto, Riedel D.Fuentes:googlescopus