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A New Effective Methodology for Semiconductor Power Devices HTRB Testing
ArticleAbstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability testsPalabras claves:High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runawayAutores:Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusEmbedded mini-Heater design for power loss remote measurement and thermal runaway control on power devices for Accelerated Life Testing
Conference ObjectAbstract: This paper points out to the use of a COTS SAFeFET in the design of an Embedded mini-Heater (EmH) adPalabras claves:ALTs, Embedded mini-Heater, Power Dissipation Measurement, SAFeFET, Temperature control, thermal runawayAutores:Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusInnovative instrumentation for HTRB tests on semiconductor power devices
Conference ObjectAbstract: An automated system designed to perform reliability tests on power transistors is reported. An innovPalabras claves:Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal controlAutores:Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.Fuentes:googlescopusLiquid-phase exfoliated graphene self-assembled films: Low-frequency noise and thermal-electric characterization
ArticleAbstract: In few years, graphene has become a revolutionary material, leading not only to applications in variPalabras claves:Differential 2D-resistivity, Few layers graphene, Liquid phase exfoliation, Low-frequency noise, Self-assembled films, ZeoliteAutores:Caputi L.S., Gabriela Viviana Tubon Usca, Jorge Hernandez-Ambato, Pace C., Tavolaro A.Fuentes:googlescopus