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2016 IEEE Ecuador Technical Chapters Meeting, ETCM 2016(1)
IEEE Transactions on Industrial Electronics(1)
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A New Effective Methodology for Semiconductor Power Devices HTRB Testing
ArticleAbstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability testsPalabras claves:High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runawayAutores:Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusEmbedded mini-Heater design for power loss remote measurement and thermal runaway control on power devices for Accelerated Life Testing
Conference ObjectAbstract: This paper points out to the use of a COTS SAFeFET in the design of an Embedded mini-Heater (EmH) adPalabras claves:ALTs, Embedded mini-Heater, Power Dissipation Measurement, SAFeFET, Temperature control, thermal runawayAutores:Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopus