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A New Effective Methodology for Semiconductor Power Devices HTRB Testing
ArticleAbstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability testsPalabras claves:High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runawayAutores:Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusA novel instrumentation for an advanced high temperature reverse bias (HTRB) testing on power transistors
ArticleAbstract: In this paper, a novel instrumentation for High Temperature Reverse Bias (HTRB) reliability test onPalabras claves:Autores:Giordano C., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopus