Alternative procedure for LR 115 chemical etching and alpha tracks counting

Conference Object

Abstract: An improved procedure for etching and analysis of alpha tracks induced in LR-115 detectors is propos

Palabras claves:

Image treatment, LR 115, Track counting, Track etching

Autores:

Arias H., Palacios D., Sajo‐Bohus L., Tony Viloria

Fuentes:

google

scopus