Mostrando 2 resultados de: 2
Filtros aplicados
Subtipo de publicación
Conference Object(2)
Publisher
2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014(1)
2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2015(1)
Área temáticas
Física aplicada(2)
Área de conocimiento
Ingeniería electrónica(1)
Origen
scopus(2)
Exploring back biasing opportunities in 28nm UTBB FD-SOI technology for subthreshold digital design
Conference ObjectAbstract: Ultra-Thin Body and Box Fully Depleted silicon on insulator (UTBB FD-SOI) has been identified as attPalabras claves:28nm UTBB FD-SOI, Back biasing, Single Well, Subthreshold digital designAutores:Fish A., Levi I., Marco Lanuzza, Ramiro TacoFuentes:scopusLow voltage ripple carry adder with low-granularity dynamic forward back-biasing in 28 nm UTBB FD-SOI
Conference ObjectAbstract: In this paper, a low voltage ripple-carry adder (RCA), designed for the ultra-thin body and box (UTBPalabras claves:FD-SOI, gate-level body biasing, Single WellAutores:Fish A., Levi I., Marco Lanuzza, Ramiro TacoFuentes:scopus