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Article(4)
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Applied Physics A: Materials Science and Processing(2)
Materials Research Express(1)
Revista de Metalurgia(1)
Área temáticas
Electricidad y electrónica(2)
Ingeniería y operaciones afines(2)
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Instrumentos de precisión y otros dispositivos(1)
Metalurgia(1)
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scopus(4)
Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopusOptical and dielectric studies of PMMA: precursors of BNT hybrid films
ArticleAbstract: In this study, polymethyl methacrylate (PMMA)-based organic–inorganic hybrid films were deposited byPalabras claves:Autores:Cruz-Valeriano E., Escamilla-Díaz T., García-Zaldivar O., Martin Yañez-Limon, Ramírez-Bon R., Serralta-Macías J.J.Fuentes:scopusStructural and mechanical properties study of CNx/MoS<inf>2</inf>multilayer coatings obtained by sputtering
ArticleAbstract: This work documents the study of samples of CNx/MoS2 multilayer coatings, deposited by magnetron spuPalabras claves:magnetron sputtering,%Nconcentration, multilayer coating (CNx/MoS ) 2Autores:Avila-Herrera C., Cruz-Valeriano E., Flores C.I.E., Gutiérrez-Peralta A.M., Martin Yañez-Limon, Morales-Hernández J., Palmerin J.M., Zambrano G.Fuentes:scopusTiN hard coating as a candidate reference material for surface metrology in chemistry: characterization and quantification by bulk and surface analyses techniques
ArticleAbstract: This study presents the synthesis and characterization of TiN hard coatings as a candidate referencePalabras claves:Anova, Materials characterization, metrology, TiN coatingAutores:Cruz-Valeriano E., Gutiérrez-Peralta A.M., Juárez-García J.M., Martin Yañez-Limon, Morales-Hernández J., Ramírez-Bon R.Fuentes:scopus