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IEEE Transactions on Nuclear Science(2)
2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings(1)
Journal of Nanotechnology(1)
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014(1)
Radiation Effects on Integrated Circuits and Systems for Space Applications(1)
Assessing the Static and Dynamic Sensitivity of a Commercial Off-the-Shelf Multicore Processor for Noncritical Avionic Applications
Conference ObjectAbstract: The present work assesses the radiation sensitivity of an affordable and performant COTS multicore pPalabras claves:Autores:Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopusError rate pbkp_rediction of applications implemented in multi-core and many-core processors
Book PartAbstract:Palabras claves:Autores:Pablo F. Ramos, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusEvaluating SEU fault-injection on parallel applications implemented on multicore processors
Conference ObjectAbstract: The widespread use of multicore processors in computing systems and the imperative necessity of explPalabras claves:Fault-Injection, Multicore, Multithreading, SEU, Soft errorAutores:Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
ArticleAbstract: This paper evaluates the error rate of a memory-bound application implemented in different commerciaPalabras claves:Accelerated testing, Error rate, fault injection, many core, Multicore, reliability, single-event effect (SEE), single-event upset (SEU), Soft errorAutores:Baylac M., Pablo F. Ramos, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusPreliminary results of SEU fault-injection on multicore processors in AMP mode
Conference ObjectAbstract: The current technological challenge for computing systems is to use multicore processors in order toPalabras claves:Asymmetric multi-processing, Fault-Injection, Multicore, SEU, Soft errorAutores:Mansour W., Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopus