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Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2 (110) surface
ArticleAbstract: The atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by thePalabras claves:Autores:Besenbacher F., Enevoldsen G.H., Foster A.S., Henry P. Pinto, Hofer W.A., Jensen M.C.R., Kühnle A., Lauritsen J.V., Reichling M.Fuentes:googlescopusThe role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO<inf>2</inf>(110) surface
ArticleAbstract: In this work we investigate some of the key factors in simultaneously recorded scanning tunneling miPalabras claves:Autores:Besenbacher F., Enevoldsen G.H., Foster A.S., Henry P. Pinto, Lauritsen J.V.Fuentes:googlescopus