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Publisher
2014 IEEE 1st International Workshop on Requirements Engineering and Testing, RET 2014 - Proceedings(1)
ACM International Conference Proceeding Series(1)
ACM Transactions on Software Engineering and Methodology(1)
CEUR Workshop Proceedings(1)
ESEM 2010 - Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement(1)
CoSTest: A Tool for Validation of Requirements at Model Level
Conference ObjectAbstract: We present CoSTest, a tool that supports the validation of Conceptual Schemas by using testing. ThePalabras claves:Conceptual Schema Testing, Conceptual Schema Validation, Model-driven validation, Requirements-based testingAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlescopusA model-level mutation tool to support the assessment of the test case quality
Book PartAbstract: Although mutation testing is a well-known technique for assessing the quality of tests, there is notPalabras claves:Class diagram mutants, Model-level mutation, Mutation tool, Test cases qualityAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlerraaescopusEvaluating the usefulness of a functional size measurement procedure to detect defects in MDD models
Conference ObjectAbstract: Models are key artifacts in Model-Driven Development (MDD) methods. To evaluate the quality of modelPalabras claves:Case study, defect detection, Functional Size, MDDAutores:Alain Abran, Giachetti G., Maŕin B., Pastor Ó., Vos T.E.J.Fuentes:scopusEffectiveness assessment of an early testing technique using model-level mutants
Conference ObjectAbstract: While modern software development technologies enhance the capabilities of model-based/driven develoPalabras claves:Class diagram mutation, Conceptual schemas testing, Effectiveness assessment, Mutation testing, Test suite effectivenessAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlescopusMutation operators for UML class diagrams
Conference ObjectAbstract: Mutation Testing is a well-established technique for assessing the quality of test cases by checkingPalabras claves:Class diagram mutation, Conceptual schemas, Mutation operators, Mutation testing, Test cases qualityAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlerraaescopusTowards a functional requirements prioritization with early mutation testing
Conference ObjectAbstract: Researchers have proposed a number of prioritization techniques to help decision makers select an opPalabras claves:Dependency, mutation score, requirements prioritization, UMLAutores:Condori-Fernández N., María Fernanda Granda Juca, Vos T.E.J.Fuentes:googlescopusTowards the automated generation of abstract test cases from requirements models
Conference ObjectAbstract: In a testing process, the design, selection, creation and execution of test cases is a very time-conPalabras claves:Communication analysis, Conceptual Schema Testing, Model-driven testing, Requirements-based testing, Test Case Generation, Test Model GenerationAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlescopusUsing ALF within the CoSTest process for validation of UML-based conceptual schema
Conference ObjectAbstract: The Unified Modelling Language (UML) is widely used for modelling software systems and its integratiPalabras claves:Conceptual Schema Validation, CoSTest tool, Model validation, UML class diagram, UML to ALFAutores:Condori-Fernández N., María Fernanda Granda Juca, Vos T.E.J.Fuentes:googlescopusUsing a functional size measurement procedure to evaluate the quality of models in MDD environments
ArticleAbstract: Models are key artifacts in Model-Driven Development (MDD) methods. To produce high-quality softwarePalabras claves:Case study, defect detection, Functional Size, Model-driven developmentAutores:Alain Abran, Giachetti G., Maŕin B., Pastor Ó., Vos T.E.J.Fuentes:scopusWhat do we know about the defect types detected in conceptual models?
Conference ObjectAbstract: In Model-Driven Development (MDD), defects are managed at the level of conceptual models because thePalabras claves:Conceptual Schema Defects, Defect Classification Scheme, Model-driven development, Systematic Mapping StudyAutores:Condori-Fernández N., María Fernanda Granda Juca, Pastor Ó., Vos T.E.J.Fuentes:googlescopus