Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2 (110) surface

Article

Abstract: The atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by the

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Autores:

Besenbacher F., Enevoldsen G.H., Foster A.S., Henry P. Pinto, Hofer W.A., Jensen M.C.R., Kühnle A., Lauritsen J.V., Reichling M.

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