Mostrando 3 resultados de: 3
Filtros aplicados
Publisher
IEEE International Symposium on Industrial Electronics(2)
Measurement: Journal of the International Measurement Confederation(1)
Área temáticas
Instrumentos de precisión y otros dispositivos(2)
Ciencias de la computación(1)
Física aplicada(1)
Sacramentos, otros ritos y actos(1)
Sistemas(1)
High resolution measurement of physical variables change for INS
Conference ObjectAbstract: Fast and accurate measurement of physical variables is critical for many systems. Inertial navigatioPalabras claves:FDS, Frequency Measurement, INS, Rational approximationsAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Lindner L., Mercorelli P., Murrieta-Rico F.N., Petranovskii V., Raymond-Herrera O., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V., W. Hernández Perdomo, Wilmar HernandezFuentes:rraaescopusIssues of exact laser ray positioning using DC motors for vision-based target detection
Conference ObjectAbstract: A new Technical Vision System for target detection using a Laser Scanner and the Dynamic TriangulatiPalabras claves:Autores:Fuentes W.F., Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Rivas-Lopez M., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V.Fuentes:scopusPulse width influence in fast frequency measurements using rational approximations
ArticleAbstract: Many applications have been proposed for the frequency measurement principle using rational approximPalabras claves:Frequency Measurement, Measurement, Pulse width, Rational approximationsAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Petranovskii V., Rivas-Lopez M., Sergyienko O., Tyrsa V.V.Fuentes:scopus