Mostrando 2 resultados de: 2
Filtros aplicados
Subtipo de publicación
Conference Object(2)
Publisher
2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014(1)
Proceedings - IEEE International Symposium on Circuits and Systems(1)
Área de conocimiento
Simulación por computadora(1)
Origen
scopus(2)
Exploring back biasing opportunities in 28nm UTBB FD-SOI technology for subthreshold digital design
Conference ObjectAbstract: Ultra-Thin Body and Box Fully Depleted silicon on insulator (UTBB FD-SOI) has been identified as attPalabras claves:28nm UTBB FD-SOI, Back biasing, Single Well, Subthreshold digital designAutores:Fish A., Levi I., Marco Lanuzza, Ramiro TacoFuentes:scopusExtended exploration of low granularity back biasing control in 28nm UTBB FD-SOI technology
Conference ObjectAbstract: Recently, we proposed a low-granularity back-bias control technique [1] optimized for the ultra-thinPalabras claves:28nm UTBB FD-SOI, Dynamic body biasing, low voltage designAutores:Fish A., Levi I., Marco Lanuzza, Ramiro TacoFuentes:scopus