Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs

Article

Abstract: Recently, the occurrence of multiple events in static tests has been investigated by checking the st

Palabras claves:

Multiple cell upsets, neutron tests, Single Event Upsets, SRAMs

Autores:

Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.

Fuentes:

scopus