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ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
Conference ObjectAbstract: The degradation of Schottky Barrier Diodes (SBDs) with a Gated Edge Termination (GET) under on-statePalabras claves:de-trapping, GaN, interfacial layer, nitride, on-state, oxide, Schottky diode, trapping rateAutores:Bakeroot B., De Jaeger B., Decoutere S., Eliana Acurio, Trojman L.Fuentes:googlescopusReliability Study on Diodes Based on AlGaN/GaN During the On State
ArticleAbstract: This work aims to study the degradation of Schottky Barrier Diodes (SBD) with a gated edge terminatiPalabras claves:AlGaN/GaN, diodes, INTRINSIC, reliability, Schottky barrierAutores:Bakeroot B., De Jaeger B., Eliana Acurio, Trojman L.Fuentes:googlescopus