Geovanna Guallichico
ESPE
3
Coauthors
1
Documentos
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Volumen de publicaciones por año
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| Año de publicación | Num. Publicaciones |
|---|---|
| 2023 | 1 |
Publicaciones por áreas de conocimiento
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| Área de conocimiento | Num. Publicaciones |
|---|---|
| Pedagogía | 1 |
Publicaciones por áreas temáticas
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| Área temática | Num. Publicaciones |
|---|---|
| Educación | 1 |
| Escuelas y sus actividades; educación especial | 1 |
| Planes de estudios | 1 |
Principales fuentes de datos
| Origen | Num. Publicaciones |
|---|---|
| Scopus | 1 |
| Google Scholar | 0 |
| RRAAE | 0 |
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Coautores destacados por número de publicaciones
| Coautor | Num. Publicaciones |
|---|---|
| Mauro Ocaña | 1 |
| Bautista C. | 1 |
| Tejada C. | 1 |
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Publicaciones del autor
Assessing Digital Competence Through Teacher Training in Early Education Teachers
Conference ObjectAbstract: Training programs on digital competences for teachers are often carried out without a thorough diagnPalabras claves:assessment, Digital Skills, learning analytics, Online Course, teacher trainingAutores:Bautista C., Geovanna Guallichico, Mauro Ocaña, Tejada C.Fuentes:scopusError rate pbkp_rediction of applications implemented in multi-core and many-core processors
Book PartAbstract:Palabras claves:Autores:Pablo F. Ramos, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusImproving reliability of multi-/many-core processors by using NMR-MPar approach
Book PartAbstract:Palabras claves:Autores:Mehaut J.F., Pablo F. Ramos, Vanessa Vargas, Velazco R.Fuentes:scopusSEU fault-injection at system level: Method, tools and preliminary results
Conference ObjectAbstract: An approach to study the effects of single event upsets (SEU) by fault injection performed at systemPalabras claves:CPU, Fault-Injection, SEU, Soft error, System-LevelAutores:Ayoubi R., Mansour W., Pablo F. Ramos, Velazco R.Fuentes:scopusEvaluation by neutron radiation of the nmr-mpar fault-tolerance approach applied to applications running on a 28-nm many-core processor
ArticleAbstract: Currently, there is a special interest in validating the use of Commercial-Off-The-Shelf (COTS) multPalabras claves:Many-core processor, partitioning, Radiation ground testing, redundancy, Single event effect, Single event upsetAutores:Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopus