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IEEE Transactions on Nuclear Science(2)
2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings(1)
IEEE Radiation Effects Data Workshop(1)
LATW 2014 - 15th IEEE Latin-American Test Workshop(1)
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014(1)
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Accelerator-based neutron irradiation of integrated circuits at GENEPI2 (France)
Conference ObjectAbstract: GENEPI2 is an accelerator facility located in Grenoble (France) which can provide neutrons of 3 MeVPalabras claves:Integrated circuits, Neutrons, Radiation facility, Radiation ground tests, SEUAutores:Baylac M., Francesca Villa, Hubert G., Mansour W., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Rey S., Rossetto O., Velazco R.Fuentes:googlescopusEvaluating SEU fault-injection on parallel applications implemented on multicore processors
Conference ObjectAbstract: The widespread use of multicore processors in computing systems and the imperative necessity of explPalabras claves:Fault-Injection, Multicore, Multithreading, SEU, Soft errorAutores:Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopusEvaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSensitivity to neutron radiation of a 45 nm SOI multi-core processor
Conference ObjectAbstract: The purpose of this paper is to evaluate the SEU sensitivity of a multi-core SoC working in two diffPalabras claves:Asymmetric multi-processing, Multi-core, SEU, Soft error, SOI, Symmetric Multi-ProcessingAutores:Baylac M., Clemente J.A., Francesca Villa, Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEU fault-injection at system level: Method, tools and preliminary results
Conference ObjectAbstract: An approach to study the effects of single event upsets (SEU) by fault injection performed at systemPalabras claves:CPU, Fault-Injection, SEU, Soft error, System-LevelAutores:Ayoubi R., Mansour W., Pablo F. Ramos, Velazco R.Fuentes:scopusPreliminary results of SEU fault-injection on multicore processors in AMP mode
Conference ObjectAbstract: The current technological challenge for computing systems is to use multicore processors in order toPalabras claves:Asymmetric multi-processing, Fault-Injection, Multicore, SEU, Soft errorAutores:Mansour W., Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopus