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Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSingle events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons
ArticleAbstract: This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low PowePalabras claves:Cots, LPSRAM, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Mecha H., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
ArticleAbstract: This paper evaluates the error rate of a memory-bound application implemented in different commerciaPalabras claves:Accelerated testing, Error rate, fault injection, many core, Multicore, reliability, single-event effect (SEE), single-event upset (SEU), Soft errorAutores:Baylac M., Pablo F. Ramos, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopus