Effects of the technology scaling down to 28nm on Ultra-Low Voltage and Power OTA performance using TCAD simulations

Conference Object

Abstract: In this paper, the effect on the performances of the technology scaling down to 28nm (bulk and plana

Palabras claves:

28nm, 90nm, Feed Forward rejection, OTA, PDK, Pseudo Differential Pair, TCAD simulation, Ultra-low power, Ultra-low voltage

Autores:

André Borja, Juan Orozco, Luis Miguel Prócel Moya, Mateo Bonilla, Mateo Valencia, Ramiro Taco, Trojman L.

Fuentes:

scopus