Mostrando 4 resultados de: 4
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Publisher
2020 IEEE 11th Latin American Symposium on Circuits and Systems, LASCAS 2020(1)
Electronics (Switzerland)(1)
IEEE Transactions on Circuits and Systems II: Express Briefs(1)
IEEE Transactions on Device and Materials Reliability(1)
Área temáticas
Ciencias de la computación(3)
Física aplicada(3)
Instrumentos de precisión y otros dispositivos(1)
Área de conocimiento
Red neuronal artificial(2)
Ciencia de materiales(1)
Ciencias de la computación(1)
Semiconductor(1)
Origen
scopus(4)
A low-voltage, low-power reconfigurable current-mode softmax circuit for analog neural networks
ArticleAbstract: This paper presents a novel low-power low-voltage analog implementation of the softmax function, witPalabras claves:Activation functions, Deep Neural Networks, Machine learning, SoftmaxAutores:Crupi F., Marco Lanuzza, Strangio S., Tatiana Moposita, Trojman L., Vatalaro M., Vladimirescu A.Fuentes:scopusEfficiency of Double-Barrier Magnetic Tunnel Junction-Based Digital eNVM Array for Neuro-Inspired Computing
ArticleAbstract: This brief deals with the impact of spin-transfer torque magnetic random access memory (STT-MRAM) cePalabras claves:double-barrier magnetic tunnel junction (DMTJ), energy-efficiency, MNIST dataset, multilayer perceptron (MPL), online classification, STT-MRAMAutores:Crupi F., Esteban Garzón, Marco Lanuzza, Tatiana Moposita, Trojman L., Vladimirescu A.Fuentes:scopusReconfigurable CMOS/STT-MTJ Non-Volatile Circuit for Logic-in-Memory Applications
Conference ObjectAbstract: The unique properties of spin-transfer torque magnetic tunnel junctions (STT-MTJs) have led to promiPalabras claves:logic-in-memory (LIM), Magnetic tunnel junction (MTJ), non-volatile logic gates, spin-transfer torque (STT)Autores:Benjamin Zambrano, Esteban Garzón, Luis Miguel Prócel Moya, Ramiro Taco, Tatiana Moposita, Trojman L.Fuentes:scopusReliability Assessment of AlGaN/GaN Schottky Barrier Diodes under ON-State Stress
ArticleAbstract: This article aims to study the degradation of Schottky Barrier Diodes (SBDs) with a Gated Edge TermiPalabras claves:AlGaN/GaN SBD, extrinsic, GET, INTRINSIC, lifetime, on-state, reliabilityAutores:Crupi F., De Jaeger B., Decoutere S., Eliana Acurio, Tatiana Moposita, Trojman L.Fuentes:scopus