Mostrando 2 resultados de: 2
Filtros aplicados
Publisher
2020 IEEE 11th Latin American Symposium on Circuits and Systems, LASCAS 2020(1)
IEEE Transactions on Device and Materials Reliability(1)
Área temáticas
Física aplicada(2)
Ciencias de la computación(1)
Instrumentos de precisión y otros dispositivos(1)
Origen
scopus(2)
Reconfigurable CMOS/STT-MTJ Non-Volatile Circuit for Logic-in-Memory Applications
Conference ObjectAbstract: The unique properties of spin-transfer torque magnetic tunnel junctions (STT-MTJs) have led to promiPalabras claves:logic-in-memory (LIM), Magnetic tunnel junction (MTJ), non-volatile logic gates, spin-transfer torque (STT)Autores:Benjamin Zambrano, Esteban Garzón, Luis Miguel Prócel Moya, Ramiro Taco, Tatiana Moposita, Trojman L.Fuentes:scopusReliability Assessment of AlGaN/GaN Schottky Barrier Diodes under ON-State Stress
ArticleAbstract: This article aims to study the degradation of Schottky Barrier Diodes (SBDs) with a Gated Edge TermiPalabras claves:AlGaN/GaN SBD, extrinsic, GET, INTRINSIC, lifetime, on-state, reliabilityAutores:Crupi F., De Jaeger B., Decoutere S., Eliana Acurio, Tatiana Moposita, Trojman L.Fuentes:scopus