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Experimental determination of tunneling characteristics and dwell times from temperature dependence of Al/Al<inf>2</inf>O<inf>3</inf>/Al junctions
ArticleAbstract: Measurements of current-voltage (I-V) characteristics of a high quality Al/Al2O3/Al junction at tempPalabras claves:Autores:Edgar J. Patiño, Kelkar N.Fuentes:scopusUltra-thin filaments revealed by the dielectric response across the metal-insulator transition in VO<inf>2</inf>
ArticleAbstract: Temperature dependent dielectric spectroscopy measurements on vanadium dioxide thin films allow us tPalabras claves:Autores:Edgar J. Patiño, Gómez M.E., Ramírez J.G., Schmidt R., Schuller I.K., Sharoni A.Fuentes:scopusSuppression of flux avalanches in superconducting films by electromagnetic braking
ArticleAbstract: Magnetic fields perpendicular to superconducting films often trigger vortex avalanches, which alwaysPalabras claves:Autores:Blamire M.G., Choi E., Colauto F., Edgar J. Patiño, Johansen T., Lee J., Lee S., Ortiz W.A.Fuentes:scopusSurface sensitivity of optical and magneto-optical and ellipsometric properties in magnetoplasmonic nanodisks
ArticleAbstract: The optical, ellipsometric, and magneto-optical surface sensitivity to dielectric environment of magPalabras claves:Autores:Armelles G., Cebollada A., Edgar J. Patiño, Herreño-Fierro C.A.Fuentes:scopus