Mostrando 10 resultados de: 107
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scopus(107)
Heat transport in epoxy and polyester carbonyl iron microcomposites: The effect of concentration and temperature
ArticleAbstract: Temperature dependence of the thermal diffusivity in composites of epoxy and polyester resins, loadePalabras claves:Lewis-Nielsen model, photopyroelectric calorimetry, Polymeric composites, Thermal diffusivityAutores:Alvarado-Gil J.J., Martin Yañez-Limon, Oleaga A., Pech-May N., Salazar A., Vales-Pinzon C., Vega-Flick A.Fuentes:scopusElectrical characteristics of lead-free Mn-doped BiFeO<inf>3</inf>–SrTiO<inf>3</inf> thin films deposited on silicon substrate using pulsed laser deposition
ArticleAbstract: Lead-free 0.4(BiFe0.995Mn0.005O3)–0.6(SrTiO3) thin films were deposited on boron-doped silicon (p-SiPalabras claves:Autores:Castillo S.J., Martin Yañez-Limon, Olguín D., Quevedo-Lopez M., Rodriguez-Davila R.A., Serralta-Macías J.J., Young C.D.Fuentes:scopusElectronic paper from facile, two-step deposition of CuS
ArticleAbstract: A method is proposed to impregnate regular cellulosic paper with semi-conductive particles of copperPalabras claves:CELLULOSE, Copper sulfide, CuS, Paper electronics, SEMICONDUCTORAutores:Esparza R., Gimenez A.J., Jiménez-Sandoval S., Luna-Barcenas G., Martin Yañez-Limon, Medellin-Rodriguez F.J.Fuentes:scopusEnergy storage performance in lead-free antiferroelectric 0.92(Bi<inf>0.54</inf>Na<inf>0.46</inf>)TiO<inf>3</inf>-0.08BaTiO<inf>3</inf>ultrathin films by pulsed laser deposition
ArticleAbstract: In this study, we report the recoverable energy density (Urec) of lead-free antiferroelectric perovsPalabras claves:Autores:Castillo S.J., Martin Yañez-Limon, Olguín D., Quevedo-Lopez M., Rodriguez-Davila R.A., Serralta-Macías J.J., Young C.D.Fuentes:scopusFerroelastic and ferroelectric phase transition in bulk Pb<inf>1-x</inf>La<inf>x</inf>(Zr<inf>0.53</inf>Ti<inf>0.47</inf>)O<inf>3</inf>
ArticleAbstract: Ceramic samples of lead zirconate titanate doped with lanthanum at the morphotropic phase boundary (Palabras claves:61.10.Nz, 77.80.Bh, 77.84.Bw, 78.20.Ek, 78.30.Jw, Dielectric properties, Infrared and Raman spectra, Optical activity, Phase transitions, X-Ray diffractionAutores:Durruthy-Rodríguez M.D., Fuentes J., Hernández-Garcia M., Hernández-Landaverde M.A., Martin Yañez-Limon, Portellez-Rodríguez J., Rodríguez-Melgarejo F.Fuentes:scopusFerroelectric hysteresis and improved fatigue of PZT (53/47) films fabricated by a simplified sol–gel acetic-acid route
ArticleAbstract: Double-layer Pb(Zr0.53Ti0.47)O3 films were fabricated by spin coating of a sol–gel acetic-acid-basedPalabras claves:Autores:Calderón-Piñar F., Espinoza-Beltran F.J., Flores-Ruiz F.J., León-Sarabia E., Martin Yañez-Limon, Mayén-Mondragón R., Rodríguez-Aranda M.C.Fuentes:scopusFerroelectric-Paraelectric Transition in A Membrane with Quenched-Induced δ-Phase of PVDF
ArticleAbstract: The stabilization of δ-phase of poly(vinylidene fluoride) PVDF in a 14 μm-thickness ferroelectric mePalabras claves:Autores:Calderón-Piñar F., Escamilla-Díaz T., García-Zaldivar O., Hernández-Landaverde M.A., Martin Yañez-Limon, Ramírez-Bon R., Ramírez-Cardona M.Fuentes:scopusFormation of Ag-Cu nanoparticles in SiO<inf>2</inf> films by sol-gel process and their effect on the film properties
Conference ObjectAbstract: Sol-gel thin films and microcrystalline powders of SiO2 doped with Ag and Cu were obtained under envPalabras claves:Autores:Díaz-Flores L.L., Garnica-Romo M.G., González-Hernandez J., Martin Yañez-Limon, Vorobiev P., Vorobiev Y.V.Fuentes:scopusFree carrier absorption in the Ge:Sb:Te system
ArticleAbstract: Absorption in the infrared region in the Ge:Sb:Te system has been observed in films having stoichiomPalabras claves:A. disordered systems, D. Optical properties, D. phase transitions, E. light absorption and reflectionAutores:Chao B.B., González-Hernandez J., López-Cruz E., Martin Yañez-Limon, Ovshinsky S.R., Strand D.Fuentes:scopusDielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopus