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Coating of AFM probes with aquatic humic and non-humic NOM to study their adhesion properties
ArticleAbstract: Atomic force microscopy (AFM) was used to study interaction forces between four Natural Organic MattPalabras claves:Adhesion force curves, Atomic force microscope, EELS, EPM, FIB, Natural organic matter, TEMAutores:Aubry C., Croue J.P., Leonardo GutierrezFuentes:googlescopusCross-sectional analysis of fouled SWRO membranes by STEM-EDS
ArticleAbstract: The intact cross-section of two fouled reverse osmosis membranes was characterized using a scanningPalabras claves:EDS, FIB, Fouling layer, Reverse osmosis membrane, STEMAutores:Anjum D.H., Aubry C., Behzad A.R., Croue J.P., Khan M.T., Leonardo GutierrezFuentes:googlescopus