Stochastic based compact model to predict highly variable electrical characteristics of organic CBRAM devices

Article

Abstract: A compact model is proposed using a stochastic approach to capture the resistive switching behavior

Palabras claves:

Conductive-bridge random access (CBRAM), Polyethylene oxide (PEO), stochastic model, Switching probability

Autores:

Deleruyelle D., Laurent Raymond, Mahato P., Silvana Guitarra, Trojman L.

Fuentes:

google

scopus