Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons

Article

Abstract: This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low Powe

Palabras claves:

Cots, LPSRAM, neutron tests, radiation hardness, reliability, Soft error, SRAM

Autores:

Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Mecha H., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.

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