Effect of Large Uniaxial Stress on the Thermoelectric Properties of Microcrystalline Silicon Thin Films

Article

Abstract: This study reports on the behaviour of the thermoelectric properties of n- and p-type hydrogenated m

Palabras claves:

annealing, microcrystalline silicon, Power factor, TEMPERATURE, Thermoelectric, thin films, uniaxial stress

Autores:

Acosta E., Bennett N.S., Christian Pillajo, Erick de la Cadena, Smirnov V., Szabo P.S.B.

Fuentes:

scopus