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Following the integration of diamond particles on the lapping-plate surface: Towards a more efficient charging process
ArticleAbstract: Even when the charging of lapping plates can extensively influence their subsequent finishing perforPalabras claves:atomic force microscopy, diamond charging process, image analysis, Lapping plate topography, Raman spectroscopyAutores:Coronado F., Espinoza-Beltrn F., Herrera-Gomez A., Martin Yañez-Limon, Mayén-Mondragón R., Mũoz-Saldãa J., Ramrez-Bon R., Vargas-Ortz R.Fuentes:scopusLaser Reflection as a Simple Prospect Tool for Nondestructive Quality Control of Charged Lapping Plates
ArticleAbstract: In the present work, a simple laser/detector-based system was assembled and mounted in situ at the pPalabras claves:Autores:Avila-Herrera C., Herrera-Gomez A., Martin Yañez-Limon, Mayén-Mondragón R., Ramírez-Bon R.Fuentes:scopus