Phonon dispersion curves in wurtzite-structure GaN determined by inelastic X-ray scattering

Article

Abstract: Inelastic X-ray scattering techniques were used to determine the lattice dynamics of wurtzite-galliu

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Autores:

Cardona M., D'Astuto M., Grzegory I., Jorge Serrano, Krisch M., Leszczynski M., Pabst M., Pavone P., Ruf T., Suski T.

Fuentes:

scopus