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Publisher
IECON Proceedings (Industrial Electronics Conference)(1)
Measurement: Journal of the International Measurement Confederation(1)
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Física aplicada(2)
Ciencias de la computación(1)
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Electricidad y electrónica(1)
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scopus(2)
Analysis of jitter influence in fast frequency measurements
ArticleAbstract: This paper presents a theoretical analysis of possible jitter impact in application of numeric critePalabras claves:Frequency Measurement, Measured value approximation by mediant fractions, Noise sources, Timing jitter, UNCERTAINTYAutores:Gurko A., Hernández-Balbuena D., Lopez M.R., Podrygalo M., Rosas Méndez P.L.A., Sergyienko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopusPrecise optical scanning for multiuse
Conference ObjectAbstract: Many approaches for remote measurement techniques for object surfaces and approaches for 3D object rPalabras claves:Autores:Hernández-Balbuena D., Sergyienko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopus