Dimensional metrology of nanometric spherical particles using AFM: I, model development

Article

Abstract: A model to obtain the tip dimension and the true size of a spherical particle from an image produced

Palabras claves:

atomic force microscopy, Broadening effect, Tapping mode, Tip Calibration

Autores:

Briceño-Valero J., Martínez L., Schilling C.H., V. J. García

Fuentes:

scopus