Following the integration of diamond particles on the lapping-plate surface: Towards a more efficient charging process

Article

Abstract: Even when the charging of lapping plates can extensively influence their subsequent finishing perfor

Palabras claves:

atomic force microscopy, diamond charging process, image analysis, Lapping plate topography, Raman spectroscopy

Autores:

Coronado F., Espinoza-Beltrn F., Herrera-Gomez A., Martin Yañez-Limon, Mayén-Mondragón R., Mũoz-Saldãa J., Ramrez-Bon R., Vargas-Ortz R.

Fuentes:

scopus