Mostrando 2 resultados de: 2
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Article(2)
Área temáticas
Electricidad y electrónica(1)
Física aplicada(1)
Ingeniería y operaciones afines(1)
Instrumentos de precisión y otros dispositivos(1)
Origen
scopus(2)
Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopusStructural and mechanical properties study of CNx/MoS<inf>2</inf>multilayer coatings obtained by sputtering
ArticleAbstract: This work documents the study of samples of CNx/MoS2 multilayer coatings, deposited by magnetron spuPalabras claves:magnetron sputtering,%Nconcentration, multilayer coating (CNx/MoS ) 2Autores:Avila-Herrera C., Cruz-Valeriano E., Flores C.I.E., Gutiérrez-Peralta A.M., Martin Yañez-Limon, Morales-Hernández J., Palmerin J.M., Zambrano G.Fuentes:scopus