Characterization of defects and surface structures in microporous materials by HRTEM, HRSEM, and AFM

Conference Object

Abstract: High-resolution transmission (HRTEM) and high-resolution scanning electron microscopy as well as ato

Palabras claves:

atomic force microscopy, Defect structure, Field emission scanning electron microscopy, MEL, MFI, MFI/MEL intergrowth, Surface structure, Transmission electron microscopy, X-Ray diffraction, Zeolites

Autores:

Keller U., López Z.E., Luis José Borrero González, Reichelt R., Ricker A., Stracke W.

Fuentes:

google

scopus