Calibration of piezoelectric positioning actuators using a reference voltage-to-displacement transducer based on quartz tuning forks

Article

Abstract: Abstract We use a piezoelectric quartz tuning fork to calibrate the displacement of ceramic piezoele

Palabras claves:

atomic force microscopy, calibration standards, Force sensors, microscopes, piezoelectric materials, Piezoelectricity, Quartz tuning fork, scanning probe microscopy, Scanning tunneling microscopy

Autores:

Agraït N., Carlos R. Arroyo, Castellanos-Gomez A., Rubio-Bollinger G.

Fuentes:

google

scopus