Innovative instrumentation for HTRB tests on semiconductor power devices

Conference Object

Abstract: An automated system designed to perform reliability tests on power transistors is reported. An innov

Palabras claves:

Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal control

Autores:

Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.

Fuentes:

google

scopus