A New Effective Methodology for Semiconductor Power Devices HTRB Testing

Article

Abstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability tests

Palabras claves:

High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runaway

Autores:

Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.

Fuentes:

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scopus