Atom-by-atom STEM investigation of defect engineering in graphene

Conference Object

Abstract:

Palabras claves:

Autores:

Bangert U., Donnelly S., Hage F.S., Haigh S.J., Hinks J.A., Kepapstoglou D.M., Kotakoski J., Mangler C., Meyer J.C., Pan C.T., Paola A. Ayala, Ramasse Q.M., Susi T., Zan R.

Fuentes:

scopus