Mostrando 5 resultados de: 5
Filtros aplicados
Publisher
2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings(1)
Applied Sciences (Switzerland)(1)
IEEE Transactions on Nuclear Science(1)
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014(1)
Radiation Effects on Integrated Circuits and Systems for Space Applications(1)
Evaluating SEU fault-injection on parallel applications implemented on multicore processors
Conference ObjectAbstract: The widespread use of multicore processors in computing systems and the imperative necessity of explPalabras claves:Fault-Injection, Multicore, Multithreading, SEU, Soft errorAutores:Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopusNMR-MPar: A fault-tolerance approach for multi-core and many-core processors
ArticleAbstract: Multi-core and many-core processors are a promising solution to achieve high performance by maintainPalabras claves:fault injection, Fault tolerance, Many-core, Multi-core, partitioning, redundancy, reliabilityAutores:Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusImproving reliability of multi-/many-core processors by using NMR-MPar approach
Book PartAbstract:Palabras claves:Autores:Mehaut J.F., Pablo F. Ramos, Vanessa Vargas, Velazco R.Fuentes:scopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusPreliminary results of SEU fault-injection on multicore processors in AMP mode
Conference ObjectAbstract: The current technological challenge for computing systems is to use multicore processors in order toPalabras claves:Asymmetric multi-processing, Fault-Injection, Multicore, SEU, Soft errorAutores:Mansour W., Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopus