Palabras claves: atomic force microscopy, diamond charging process, Height correlation function, Lapping plate topography
Autores: Espinoza-Beltran F.J., Martin Yañez-Limon, Mayén-Mondragón R., Montero-Camacho O., Mũoz-Saldãa J., Ramírez-Bon R., Rocha-Gallardo H.