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Electricidad y electrónica(2)
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scopus(2)
Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopusOptical and dielectric studies of PMMA: precursors of BNT hybrid films
ArticleAbstract: In this study, polymethyl methacrylate (PMMA)-based organic–inorganic hybrid films were deposited byPalabras claves:Autores:Cruz-Valeriano E., Escamilla-Díaz T., García-Zaldivar O., Martin Yañez-Limon, Ramírez-Bon R., Serralta-Macías J.J.Fuentes:scopus