Documentos de Jouan P.Y. | REDI

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Mostrando 4 resultados de: 4

Filtros aplicados

Área de conocimiento: "Ciencia de materiales"

Subtipo de publicación

Publisher

Applied Surface Science(1)

EPJ Applied Physics(1)

Journal of Applied Physics(1)

Journal of Physical Chemistry B(1)

Área temáticas

Física aplicada(3)

Ingeniería y operaciones afines(2)

Electricidad y electrónica(1)

Luz y radiaciones afines(1)

Área de conocimiento

Película delgada(2)

Ingeniería electrónica(1)

Año de Publicación

Origen

Palabras Claves

DC reactive sputtering(1)

Electrical characterization(1)

Nickel oxide(1)

Nickel vacancy(1)

AIN thin films deposited by DC reactive magnetron sputtering: Effect of oxygen on film growth

Abstract: Aluminum nitride is a ceramic compound with many technological applications in many fields, for exam

Palabras claves:

Abdallah B., Burgi J., Djouadi M.A., Ferrón J., Feugeas J.N., Gautron E., Gõmez B.J., Javier García Molleja, Jouan P.Y.

Process- and optoelectronic-control of NiO<inf>x</inf> thin films deposited by reactive high power impulse magnetron sputtering

Abstract: In this contribution, based on the analyses of the discharge behavior as well as final properties of

Palabras claves:

Corraze B., Delfour-Peyrethon B., Ferrec A., Goullet A., Hamon J., Javier García Molleja, Jouan P.Y., Keraudy J., Payen C., Richard-Plouet M.

Structural, morphological and electrical properties of nickel oxide thin films deposited by reactive sputtering

Abstract: This paper is devoted to the study of the influence of oxygen content in the nickel oxide films on t

Palabras claves:

C-AFM, DC reactive sputtering, Electrical characterization, Nickel oxide, Nickel vacancy

Corraze B., Ferrec A., Goullet A., Javier García Molleja, Jouan P.Y., Keraudy J., Richard-Plouet M.

Synchrotron radiation applied to real-Time studies of the kinetics of growth of aluminum nitride thin multilayers

Abstract: This article reports the design, construction, and first use of an experimental device consisting of

Palabras claves:

Bemporad E., Burgi J., Craievich A.F., De Felicis D., Djouadi M.A., Feugeas J.N., Javier García Molleja, Jouan P.Y., Kellermann G., Neuenschwander R., Piccoli M.