Mostrando 4 resultados de: 4
Filtros aplicados
Publisher
IEEE International Symposium on Industrial Electronics(2)
Applied Physics A: Materials Science and Processing(1)
IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society(1)
Área de conocimiento
Cerámico(1)
Ciencia de materiales(1)
Procesamiento de señales(1)
Sensor(1)
Sistema de control(1)
Origen
rraae(1)
High resolution measurement of physical variables change for INS
Conference ObjectAbstract: Fast and accurate measurement of physical variables is critical for many systems. Inertial navigatioPalabras claves:FDS, Frequency Measurement, INS, Rational approximationsAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Lindner L., Mercorelli P., Murrieta-Rico F.N., Petranovskii V., Raymond-Herrera O., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V., W. Hernández Perdomo, Wilmar HernandezFuentes:rraaescopusPFM characterization of (K<inf>0.5</inf>Na<inf>0.5</inf>) <inf>0.95</inf>La<inf>0.05</inf>(Nb<inf>0.9</inf>Ti<inf>0.05</inf>)O <inf>2.9</inf> ceramics lead free
ArticleAbstract: The results of ferroelectric properties studies of KNN doped with La and Ti and sintered at temperatPalabras claves:Autores:Durruthy-Rodríguez M.D., Espinoza-Beltran F.J., Fuentes J., Gervacio-Arciniega J.J., Martin Yañez-Limon, Pérez A., Portellez-Rodríguez J., Raymond-Herrera O., Siqueiros J.M.Fuentes:scopusInstability measurement in time-frequency references used on autonomous navigation systems
Conference ObjectAbstract: In all the real-time control systems used on autonomous navigation systems (ANS), a computing systemPalabras claves:drift, Frequency Measurement, jitter, Real-time controlAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Lindner L., Melnyk V.I., Murrieta-Rico F.N., Petranovskii V., Raymond-Herrera O., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V.Fuentes:scopusRational approximations principle for frequency shifts measurement in frequency domain sensors
Conference ObjectAbstract: Frequency domain sensors (FDS) are important elements in control, data acquisition and monitoring syPalabras claves:FDS, Frequency Measurement, frequency shiftAutores:Fuentes W.F., Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Murrieta-Rico F.N., Petranovskii V., Raymond-Herrera O., Rodriguez-Quinonez J.C., Sergyienko O., Tchernykh A., Tyrsa V.V.Fuentes:scopus