Palabras claves: Optical microscopy, Phase percentage, reference material, Scanning Electron Microscopy, X-ray fluorescence
Autores: Herrera-Basurto R., Juárez-García J.M., Manzano-Ramírez A., Martin Yañez-Limon, Mercader-Trejo F., Rodríguez-López A., Rojas-Chávez H.