Mostrando 4 resultados de: 4
Filtros aplicados
Publisher
Beilstein Journal of Nanotechnology(1)
Microscopy and Microanalysis(1)
Physical Review Letters(1)
Science Advances(1)
Área temáticas
Ingeniería y operaciones afines(3)
Ciencias de la computación(1)
Electricidad y electrónica(1)
Física(1)
Física aplicada(1)
Área de conocimiento
Ciencia de materiales(4)
Atom-by-atom STEM investigation of defect engineering in graphene
Conference ObjectAbstract:Palabras claves:Autores:Bangert U., Donnelly S., Hage F.S., Haigh S.J., Hinks J.A., Kepapstoglou D.M., Kotakoski J., Mangler C., Meyer J.C., Pan C.T., Paola A. Ayala, Ramasse Q.M., Susi T., Zan R.Fuentes:scopusCore level binding energies of functionalized and defective graphene
ArticleAbstract: X-ray photoelectron spectroscopy (XPS) is a widely used tool for studying the chemical composition oPalabras claves:Core level, Defects, density functional theory, Graphene, X-ray photoelectron spectroscopyAutores:Havu P., Kaukonen M., Kauppinen E.I., Ljungberg M.P., Paola A. Ayala, Susi T.Fuentes:scopusEngineering single-atom dynamics with electron irradiation
ArticleAbstract: Atomic engineering is envisioned to involve selectively inducing the desired dynamics of single atomPalabras claves:Autores:Dong M., Hofer C., Idrobo J.C., Kong J., Kotakoski J., Leonardo Basile, Li J., Meyer J.C., Su C., Su G., Susi T., Tripathi M., Wang H., Wang Z., Yan Q.B., Zhang Z.Fuentes:googlescopusSilicon-carbon bond inversions driven by 60-kev electrons in graphene
ArticleAbstract: We demonstrate that 60-keV electron irradiation drives the diffusion of threefold-coordinated Si dopPalabras claves:Autores:Bangert U., Kepaptsoglou D., Kotakoski J., Krivanek O.L., Lovejoy T.C., Mangler C., Meyer J.C., Paola A. Ayala, Ramasse Q.M., Susi T., Zan R.Fuentes:scopus