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Beilstein Journal of Nanotechnology(1)
Microscopy and Microanalysis(1)
Physical Review Letters(1)
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Ingeniería y operaciones afines(2)
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scopus(3)
Atom-by-atom STEM investigation of defect engineering in graphene
Conference ObjectAbstract:Palabras claves:Autores:Bangert U., Donnelly S., Hage F.S., Haigh S.J., Hinks J.A., Kepapstoglou D.M., Kotakoski J., Mangler C., Meyer J.C., Pan C.T., Paola A. Ayala, Ramasse Q.M., Susi T., Zan R.Fuentes:scopusCore level binding energies of functionalized and defective graphene
ArticleAbstract: X-ray photoelectron spectroscopy (XPS) is a widely used tool for studying the chemical composition oPalabras claves:Core level, Defects, density functional theory, Graphene, X-ray photoelectron spectroscopyAutores:Havu P., Kaukonen M., Kauppinen E.I., Ljungberg M.P., Paola A. Ayala, Susi T.Fuentes:scopusSilicon-carbon bond inversions driven by 60-kev electrons in graphene
ArticleAbstract: We demonstrate that 60-keV electron irradiation drives the diffusion of threefold-coordinated Si dopPalabras claves:Autores:Bangert U., Kepaptsoglou D., Kotakoski J., Krivanek O.L., Lovejoy T.C., Mangler C., Meyer J.C., Paola A. Ayala, Ramasse Q.M., Susi T., Zan R.Fuentes:scopus