Electrical and electroluminescent characterization of nanometric multilayers of SiO<inf>X</inf>/SiO<inf>Y</inf> obtained by LPCVD including non-normal emission

Article

Abstract: This work describes the analysis and fabrication by Low Pressure Chemical Vapor Deposition of two li

Palabras claves:

Autores:

Aceves-Mijares M., Alarcón-Salazar J., Ignacio Enrique Zaldívar-Huerta

Fuentes:

scopus