Raman spectroscopy of silicon with nanostructured surface

Article

Abstract: We compared the morphology and Raman response of nanoscale shaped surfaces of Si substrates versus m

Palabras claves:

Black silicon, Nanolayer RuO -IrO 2 2, SERS

Autores:

Breza J., Fröhlich K., Hušeková K., Isabella O., Kadlečíková M., Mikolášek M., Paul Procel, Vančo Ľ., Zeman M.

Fuentes:

scopus