Palabras claves: dynamic security assessment, emergency control, load tap changers, Long-term dynamics, overexcitation limiters, Test Systems, voltage instability
Autores: Claudio A. Cañizares, Glavic M., Kanatas M., Lima L., Milano F., Papangelis L., Ramos Tf Chair R., Rosehart W.D., Santos J.A.D., Tamimi B., Taranto G., Van Cutsem T., Vournas C.